ISDA: 4GZE

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.5	289	0.6 M NaCl, 0.1 M MES/NaOH, 20% PEG4000, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Unit Cell:

a: 96.086 Å b: 96.086 Å c: 289.140 Å α: 90.00° β: 90.00° γ: 120.00°

Symmetry:

Space Group: P 31

Crystal Properties:

Matthew's Coefficient: 2.30 Solvent Content: 46.56

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.31	30.00	130248	1248	99.41	0.17421	0.21338	33.569

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.31	50.0	99.6	0.079	?	21.8	4.4	130885	130353	?	-3	45.2

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.31	2.35	96.7	?	?	2.75	2.8	6313

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 19-BM	0.9794	APS	19-BM

Software