4GWM

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.0 293 18.2%(wt/vol) PEG8000, 1M LiCl, 0.1M bicine, pH 9.0, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 69.620 Å b: 71.120 Å c: 85.740 Å α: 74.87° β: 80.08° γ: 65.13°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.83 Solvent Content: 56.55
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD, Molecular Replacement THROUGHOUT 1.85 48.45 118473 1124 96.56 0.1684 0.1879 39.52
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 48.45 96.6 0.069 ? ? ? ? 118474 0 0 27.24
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.85 1.95 96.6 ? ? ? ? 118474
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID23-1 0.9763 ESRF ID23-1
Software
Software Name Purpose Version
ProDC data collection .
SHELXS phasing .
BUSTER refinement 2.11.2
XDS data reduction .
SCALA data scaling .