X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 277 2 M ammonium sulfate, pH 7.0, vapor diffusion, hanging drop, temperature 277K
Unit Cell:
a: 129.330 Å b: 73.800 Å c: 134.290 Å α: 90.000° β: 109.300° γ: 90.000°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.32 Solvent Content: 62.95
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.9400 53.0200 314899 15957 90.7600 0.2394 0.2657 16.3786
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.940 53.02 91.300 0.091 ? 9.940 3.83 ? 314901 ? -3.000 21.652
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.940 1.990 64.400 ? ? 3.210 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E+ SUPERBRIGHT 1.5418 ? ?
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.3.0
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.11
CrystalClear data collection .
XDS data reduction .
BUSTER refinement 2.10.0