X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.8 293 100 mM Tris-HCl, 0.2 M Li2SO4, 1.3 M K/Na tartrate, pH 6.8, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 87.900 Å b: 147.790 Å c: 109.920 Å α: 90.00° β: 113.06° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.73 Solvent Content: 54.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.920 29.832 195699 5872 99.74 0.1589 0.1859 44.10
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.92 47.85 99.5 ? ? ? ? ? 195699 -3 -3 39.65
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.92 2.008 98.8 ? ? 3.37 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.99987 SLS X06DA
Software
Software Name Purpose Version
PHENIX refinement 1.8.1_1168
BUSTER refinement 2.10.0
XDS data reduction .
XSCALE data scaling .
PHASER phasing .
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