X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.6 291 0.975M Natrium Citrate, 0.1M HEPES, pH 7.6, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 122.240 Å b: 133.350 Å c: 137.500 Å α: 108.25° β: 104.83° γ: 103.83°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.55 Solvent Content: 65.32
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 3.20 29.736 121622 24324 98.46 0.2755 0.2994 159.9600
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.090 50.000 97.000 0.045 ? 16.870 3.9 132686 132663 -3.000 -3.000 110.330
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.090 3.280 94.500 ? ? 1.950 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.97918 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
PHENIX refinement 1.8_1069
SHELX phasing .
RESOLVE phasing 2.13
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.11
ADSC data collection Quantum
SHELXD phasing .
XSCALE data scaling .