X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 100mM Bis-Tris, 100mM ammonium sulfate, 25% PEG-3350, pH 6.5, Vapor diffusion, hanging drop, temperature 293K
Unit Cell:
a: 75.178 Å b: 76.291 Å c: 81.529 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.39 Solvent Content: 48.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.8500 35.8350 36974 1850 90.8500 0.1919 0.2401 28.0384
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.850 35.835 91.700 ? 0.063 8.900 3.100 37078 37078 ? ? 20.150
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.850 1.950 77.600 ? 0.415 1.200 2.200 4489
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.98 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
SCALA data scaling 3.3.16
PHENIX refinement 1.7.3_928
PDB_EXTRACT data extraction 3.11
XSCALE data scaling .
BALBES phasing .