ISDA: 4G2B

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	4.6	277	Crystallization screens were conducted using 1:1 sitting drops at RT and 4 C. The C-terminal domain (137-322) (~20mg/mL) gave large rectangular crystals in 1.15M LiSO4, 0.1M NaOAc, pH 4.6 (4 C) when optimized (1:1 hanging drops). However these were very fragile and consisted of multiple lattices overlaid on each other as observed in their diffraction patterns. SseI 137-322 was then reductively methylated and rescreened. It gave multiple crystals of differing morphologies in a number of conditions containing MES, Tris, and HEPES buffers pH 6.0 - 9.0, and 1.6 to 2.0M (NH4)SO4. To obtain single crystals, crystals from 0.1M MES pH 7.1, 1.8M (NH4)SO4 were crushed and microseeded into pre-equilibrated (2 hrs) drops containing protein/reservoir solution (0.1M MES pH 5.5, 1.6M (NH4)SO4). This procedure produced single, small, rectangular crystals. To obtain larger crystals, single crystals obtained in the previous step were macroseeded into pre-equilibrated drops, giving large, thin rectangular plates that were well-diffracting. SeMet-substituted crystals of 137-322 were obtained in the same conditions but gave large crystals directly without any seeding. Crystals were then cryoprotected by transfer in small increments into mother liquor supplemented with 25% glycerol. , VAPOR DIFFUSION, HANGING DROP, temperature 277K

Unit Cell:

a: 53.818 Å b: 62.506 Å c: 110.099 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 21 21 21

Crystal Properties:

Matthew's Coefficient: 2.17 Solvent Content: 43.34

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.05	27.18	22722	1227	99.86	0.19579	0.23780	33.336

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.05	?	?	?	?	?	?	?	22722	?	?	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		93 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	NSLS BEAMLINE X29A	1.0809	NSLS	X29A

Software