X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 298 0.2M tri-Sodium citrate, 0.1M Tris-HCl pH 8.5, 30%(v/v) PEG400, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 76.836 Å b: 83.211 Å c: 95.328 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 3.25 Solvent Content: 62.15
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 3.44 20 7538 944 99.27 0.21301 0.25596 46.157
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.44 50 99.9 0.122 0.122 12.4 4.3 ? 15712 2 2 64.5
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.44 3.50 98.0 ? 0.529 2.54 3.9 782
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE BM14 0.97755 ESRF BM14
Software
Software Name Purpose Version
MxCuBE data collection .
SHELX model building Suite (CCP4)
REFMAC refinement 5.6.0116
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELX phasing Suite (CCP4)