X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 291 28-30% (w/v), PEG3350, Sigma-Aldrich), 50mM potassium phosphate, pH 7.0, VAPOR DIFFUSION, temperature 291K
Unit Cell:
a: 58.745 Å b: 58.664 Å c: 95.726 Å α: 87.85° β: 75.92° γ: 73.47°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.30 Solvent Content: 46.58
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.301 47.365 47379 1991 89.83 0.2431 0.3166 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.30 47.365 90.6 0.095 0.095 22.480 34 ? 52509 0 -3 42.85
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.34 90.6 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRF BEAMLINE BL17U 0.9795 SSRF BL17U
Software
Software Name Purpose Version
HKL-2000 data collection .
PHENIX model building .
PHENIX refinement (phenix.refine: 1.7.3_928)
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .