X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 277 1.8 M ammonium sulphate, 0.1 M Na-acetate, pH 4.6, vapor diffusion, sitting drop, temperature 277K
Unit Cell:
a: 77.230 Å b: 77.230 Å c: 362.820 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 61 2 2
Crystal Properties:
Matthew's Coefficient: 2.57 Solvent Content: 52.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIRAS ? 2.7503 34.5270 17714 901 99.8900 0.2545 0.2854 111.2585
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.750 36.3 99.800 0.064 ? 26.700 12.9 17859 17822 ? -3.000 75.506
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.750 2.820 99.600 ? ? 2.650 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I911-2 1.03911 MAX II I911-2
Software
Software Name Purpose Version
XSCALE data scaling .
SHARP phasing .
SOLOMON phasing .
PHENIX refinement 1.8_1069
PDB_EXTRACT data extraction 3.11
XDS data reduction .