X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.9 293 0.12 M Postassium Thiocyanate, 0.1 M Tris pH7.9, 28% PEG MME 2000, 0.5% beta-octylglucopyranoside, batch, temperature 293K
Unit Cell:
a: 83.101 Å b: 34.240 Å c: 138.779 Å α: 90.000° β: 101.310° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.16 Solvent Content: 43.11
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.5100 45.3600 13426 662 ? 0.2219 0.2763 32.5445
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.500 50.000 99.400 0.078 ? 16.500 3.600 ? 13488 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.500 2.590 99.700 ? ? ? 3.700 1297
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.9792 APS 24-ID-E
Software
Software Name Purpose Version
SCALEPACK data scaling .
PHASER phasing .
BUSTER-TNT refinement BUSTER 2.8.0
PDB_EXTRACT data extraction 3.11
HKL-2000 data reduction .
HKL-2000 data scaling .
BUSTER refinement 2.8.0