X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.3 291 100 mM tris HCl pH8.3, 100 mM Ammonium Sulfate, 18% PEG 3350, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 140.040 Å b: 66.900 Å c: 102.820 Å α: 90.00° β: 97.59° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.16 Solvent Content: 42.93
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.47 33.34 33911 1716 99.43 0.2105 0.2614 53.94
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.47 101.9 99.5 0.064 ? 13.7 3.6 34307 34136 2.0 2.0 56.47
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.47 2.53 99.7 ? ? 2.2 3.6 2517
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.0 NSLS X29A
Software
Software Name Purpose Version
ADSC data collection Quantum
PHASER phasing .
BUSTER refinement 2.11.1
MOSFLM data reduction .
SCALA data scaling .
Feedback Form
Name
Email
Institute
Feedback