X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 296 VIM-31 (17 mg/ml) 1:1 dilution with the condition 0.3 M sodium acetate, 0.1 M Tris-HCl pH 8.5, 20 % PEG4000 1.0 mM TCEP, VAPOR DIFFUSION, SITTING DROP, temperature 296K
Unit Cell:
a: 64.600 Å b: 74.390 Å c: 78.720 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 1.87 Solvent Content: 34.40
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.6100 54.068 24650 1257 99.0600 0.1493 0.1856 23.0752
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.61 54.068 97.900 ? 0.059 15.500 4.900 24650 24650 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.600 1.690 87.500 ? 0.404 1.900 4.500 3177
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ENRAF-NONIUS FR591 1.5418 ? ?
Software
Software Name Purpose Version
SCALA data scaling 3.3.20
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
MAR345dtb data collection .
MOSFLM data reduction .
MOLREP phasing .