X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 291 25% PEG-3350, 0.2M ammounium sulfate, 0.1M sodium cacodylate, praseodymium(III) acetate, pH 5.5, vapor diffusion, temperature 291K
Unit Cell:
a: 40.339 Å b: 40.339 Å c: 145.750 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 2.0 Solvent Content: 37.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.8020 28.5400 11711 552 98.3870 0.1770 0.2162 20.3910
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.80 28.5400 98.86 0.093 ? 25.0113 12.46 ? 11740 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.80 1.90 97.08 ? ? ? 12.73 1628
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E 1.5418 ? ?
Software
Software Name Purpose Version
SCALA data scaling CCP4_3.3.20
SHELX phasing .
REFMAC refinement 5.7.0027
PDB_EXTRACT data extraction 3.11
XDS data reduction .