ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	5.6	291	EHG-ALPHA-1 AT 15 MG/ML IN CRYSTALLIZATION BUFFER (50 MM HEPES PH 6.5, 150 MM NACL, 10 MM MGCL2, 10 MM NAF, 30 MICROM ALCL3, AND 50 MICROM GDP) WAS MIXED 1:1 AND EQUILIBRATED AGAINST CRYSTALLIZATION SOLUTION CONTAINING 1.5 M AMMONIUM SULFATE, 175 MM K/NA TARTRATE, AND 100 MM SODIUM CITRATE PH 5.6. 250 MM AMMONIUM ACETATE WAS ADDED TO THE WELL SOLUTION AFTER SETTING THE DROPS, VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 291K

Unit Cell:

a: 56.671 Å b: 57.174 Å c: 231.289 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 21 21 21

Crystal Properties:

Matthew's Coefficient: 2.42 Solvent Content: 49.26

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	?	2.62	45.90	23398	1172	99.3	0.193	0.258	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.600	45.900	99.3	?	?	?	?	?	43503	?	1.370	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.60	2.62	100.0	?	?	2.600	13.30	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 23-ID-D	?	APS	23-ID-D

Software