ISDA: 4FI5

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	289	HahaA.17785.a.A16.PS01490 at 20 mg/mL against Morpheus screen condition g8, 12.5% PEG1000, 12.5% PEG3350, 12.5% MPD, 20 mM Na-formate, 20 mM Na-citrate, 20 mM Ammonium acetate, 20 mM NaK tartrate, 100 mM MOPS/HEPES-Na pH 7.5, crystal tracking ID 234641g8, puck ID hky1-5, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Unit Cell:

a: 77.400 Å b: 77.400 Å c: 36.520 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: P 32 2 1

Crystal Properties:

Matthew's Coefficient: 2.46 Solvent Content: 50.03

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.2000	50.0000	6594	645	99.7600	0.1957	0.2354	35.4455

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.200	50	99.800	0.078	?	21.380	7.3	6619	6604	?	-3.000	37.089

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.200	2.260	100.000	?	?	3.900	?	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SSRL BEAMLINE BL7-1	1.003317	SSRL	BL7-1

Software