ISDA: 4FI4

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.5	?	0.16M MAGNESIUM CHLORIDE, 0.08M TRIS HCL, PH 8.5, 24% PEG4K, 20% (VOL/VOL) GLYCEROL, VAPOR DIFFUSION, SITTING DROP, TEMPERATURE 294K

Unit Cell:

a: 137.617 Å b: 137.617 Å c: 264.696 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: I 4 2 2

Crystal Properties:

Matthew's Coefficient: 2.22 Solvent Content: 44.59

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.00	47.74	81029	4263	99.59	0.15133	0.20379	35.057

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.00	50.000	100.0	?	0.091	7.5000	7.500	?	85719	?	-5.000	28.738

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.00	2.03	100.0	?	?	2.00	7.50	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	NSLS BEAMLINE X29A	?	NSLS	X29A

Software