4FFS

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 293 0.1M tri-sodium citrate, 0.1M Tris, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 157.732 Å b: 157.732 Å c: 157.732 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 4 3 2
Crystal Properties:
Matthew's Coefficient: 3.11 Solvent Content: 60.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.90 42.19 25229 1320 99.84 0.16275 0.19161 26.016
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.90 50.00 99.9 0.099 0.099 23.2 7.0 26569 26569 0 0 22.8
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 1.93 100 ? 0.615 2.9 7.1 1301
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.10010 NSLS X29A
Software
Software Name Purpose Version
XDisplayF data collection .
MOLREP phasing .
REFMAC refinement 5.7.0025
HKL-3000 data reduction .
HKL-3000 data scaling .