X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.7 295 0.2M Potassium sulfate, 20% PEG3350, cryoprotected with 10% glycerol, VAPOR DIFFUSION, HANGING DROP, temperature 295K, pH 6.7
Unit Cell:
a: 50.463 Å b: 95.228 Å c: 115.465 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: C 2 2 21
Crystal Properties:
Matthew's Coefficient: 1.88 Solvent Content: 34.61
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.000 29.932 19119 986 99.61 0.1736 0.2258 25.9
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.00 50.0 99.9 0.072 0.072 38.4 7.3 19233 19207 -3.0 ? 25.9
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.00 2.03 99.3 ? 0.364 4.9 5.4 912
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97937 APS 19-BM
Software
Software Name Purpose Version
HKL-3000 data collection .
SHELXCD phasing .
PHENIX refinement (phenix.refine: 1.7.3_928)
HKL-3000 data reduction .
HKL-3000 data scaling .