X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 291 0.5 uL protein + 0.5 uL buffer (20% PEG3350, 0.2 M tri-lithium citrate) + 0.2 uL (+/-)-1,3-butanediol, VAPOR DIFFUSION, SITTING DROP, temperature 291K
Unit Cell:
a: 127.837 Å b: 130.825 Å c: 192.150 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.61 Solvent Content: 52.89
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION ? THROUGHOUT 2.1000 39.6450 187327 9425 99.8790 0.1870 0.2261 27.2920
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.10 40.00 99.95 0.148 ? 13.6649 7.08 187512 187511 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.21 99.91 ? ? ? 6.68 27124
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97931 APS 19-ID
Software
Software Name Purpose Version
SCALA data scaling CCP4_3.3.16
PHASER phasing .
REFMAC refinement 5.7.0027
PDB_EXTRACT data extraction 3.11
ADSC data collection Quantum
XDS data reduction .