ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	290	Internal tracking number 232316c5. Morpheus well C5, 10% w/v PEG20K, 20% PEG MME 550, 0.03M NPS (Sodium nitrate, disodium hydrogen phosphate, ammonium sulfate ), 0.1M MOPS / HEPES-Na pH 7.5 ButhA.18002.a.A1.PS01197 20.0mg/ml., vapor diffusion, sitting drop, temperature 290K

Unit Cell:

a: 72.090 Å b: 73.080 Å c: 116.890 Å α: 90.000° β: 102.760° γ: 90.000°

Symmetry:

Space Group: P 1 21 1

Crystal Properties:

Matthew's Coefficient: 2.48 Solvent Content: 50.37

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	1.750	49.300	119282	5975	99.860	0.154	0.180	23.246

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.750	49.30	99.800	0.059	?	18.480	5.74	119513	119307	0	-3.00	28.063

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.75	1.80	99.90	?	?	3.4	?	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	ALS BEAMLINE 5.0.2	1.033200	ALS	5.0.2

Software