X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 298 0.2M ammonium acetate, 0.1M Bis-Tris-HCl, pH 5.5, 25% PEG3350. Overnight soak with 10mM NAD, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 85.438 Å b: 96.905 Å c: 121.811 Å α: 90.000° β: 89.980° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.31 Solvent Content: 46.79
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.0100 19.9100 126673 6378 95.5500 0.1828 0.2326 51.1832
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.010 50.000 95.800 0.095 ? 7.000 3.300 ? 126866 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.010 2.040 70.200 ? ? ? 2.300 4649
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X29A 1.075 NSLS X29A
Software
Software Name Purpose Version
SCALEPACK data scaling .
PHASER phasing 2.3.0
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
CBASS data collection .
HKL-3000 data reduction .
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