X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 289 MyabA.01189.a.A1 PS00933 at 28 mg/mL supplemented with 0.5 M KI against Morpheus screen condition D4, 12.5% PEG 1000, 12.5% PEG 3350, 12.5% MPD, 0.1 M MES/imidazole pH 6.5, 0.02 M alcohols, crystal tracking ID 233762d4, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 78.640 Å b: 46.340 Å c: 84.130 Å α: 90.000° β: 93.140° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.14 Solvent Content: 42.42
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.1000 50 35731 1790 99.7900 0.1875 0.2345 32.9471
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.100 50 99.800 0.072 ? 17.460 7.1 35785 35731 ? -3.000 36.245
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.100 2.150 100.000 ? ? 4.000 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL7-1 1.5418 SSRL BL7-1
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.1.4
REFMAC refinement .
PDB_EXTRACT data extraction 3.11
XDS data reduction .
Feedback Form
Name
Email
Institute
Feedback