X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.0 298 0.1 M Bis-Tris propane pH 9.0, 10% PEG 200, 18% PEG 8,000, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 80.140 Å b: 85.026 Å c: 96.916 Å α: 69.82° β: 71.37° γ: 85.66°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.66 Solvent Content: 53.75
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.198 49.797 111229 5572 96.10 0.1709 0.2098 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.198 49.8 96.1 ? ? ? ? ? ? 2.0 2.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 298 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 0.9774 ALS 8.2.2
Software
Software Name Purpose Version
BOS data collection .
PHENIX model building .
PHENIX refinement (phenix.refine: dev_718)
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .
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