X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 289 0.14 M CaCl2, 0.07 M Na acetate/HCl, 14% 2-propanol, 30% glycerol, pH 4.6, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 54.400 Å b: 54.400 Å c: 261.090 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 61 2 2
Crystal Properties:
Matthew's Coefficient: 2.27 Solvent Content: 45.91
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.70 20.07 26081 1314 98.72 0.1959 0.2149 40.27
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.70 35.00 98.7 0.074 ? 23.2 6.6 26515 26172 ? -3 31.40
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.70 1.73 100 ? ? 2.43 6.1 1263
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.9792914 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
SHELX model building .
MLPHARE phasing .
DM model building .
ARP/wARP model building .
Coot model building .
BUSTER refinement 2.10.0
HKL-3000 data reduction .
HKL-3000 data scaling .
SHELX phasing .
DM phasing .
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