X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5 291 14% PEG 8000, 0.125M calcium chloride, 0.1M sodium acetate, 0.02M 1,2-hexanediol, VAPOR DIFFUSION, HANGING DROP, temperature 291K
Unit Cell:
a: 169.768 Å b: 84.249 Å c: 90.132 Å α: 90.00° β: 100.31° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.32 Solvent Content: 46.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.650 46.450 149955 7520 99.95 0.1701 0.1974 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.65 46.45 99.9 ? 0.058 15.63 4.1 ? 149966 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.65 1.7 99.9 ? 0.377 3.59 4.2 12794
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X6A 1.0000 NSLS X6A
Software
Software Name Purpose Version
PHENIX model building .
PHENIX refinement (phenix.refine: 1.7.3_928)
XDS data reduction .
XDS data scaling .
PHENIX phasing .