4ERM
X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 100 K |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
SYNCHROTRON | APS BEAMLINE 24-ID-C | 0.9794 | APS | 24-ID-C |
Software Name | Purpose | Version |
---|---|---|
HKL-2000 | data collection | . |
CNS | refinement | . |
HKL-2000 | data reduction | . |
HKL-2000 | data scaling | . |
CNS | phasing | . |