X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 298 0.2 M ammonium sulfate, 0.2 M sodium chloride, 0.1 M MES pH 6.5, 30% PEG 5K MME, cryoprotectant: paratone oil, VAPOR DIFFUSION, SITTING DROP, temperature 298K
Unit Cell:
a: 78.682 Å b: 82.341 Å c: 117.468 Å α: 90.00° β: 90.14° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.28 Solvent Content: 46.10
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.017 19.915 97095 1871 98.20 0.1824 0.2330 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.017 20.00 98.6 ? 0.112 16.83 7.7 98585 97205 0 2.00 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.017 2.05 95.4 ? 0.547 2.86 6.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 0.97856 APS 21-ID-G
Software
Software Name Purpose Version
HKL-3000 data collection .
PHENIX model building (phenix.autosol)
PHENIX refinement (phenix.refine: 1.7.3_928)
HKL-3000 data reduction .
HKL-3000 data scaling .
PHENIX phasing .
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