X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 288 1.7 M (NH4)2SO4, 0.2 M Li2SO4, 4 % Gamma-butyrolactone, 0.1 M Tris pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 288K
Unit Cell:
a: 121.570 Å b: 121.570 Å c: 121.570 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 21 3
Crystal Properties:
Matthew's Coefficient: 5.48 Solvent Content: 77.54
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.002 24.815 11245 1097 96.83 0.2597 0.3113 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.00 50 96.9 0.064 ? 11.62 3.32 ? 11254 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.00 3.08 93.3 ? ? 1.76 3.12 791
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON MAX II BEAMLINE I911-2 1.038 MAX II I911-2
Software
Software Name Purpose Version
PHASER phasing .
PHENIX refinement (phenix.refine: 1.7.2_869)
XDS data reduction .
XSCALE data scaling .