ISDA

4E6N

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.75	303	6% PEG6000, 0.5M NACL, 25MM CACL2, 5% METHANOL, 50MM HEPES, 50 MM TRIS-HCL, pH 7.75, VAPOR DIFFUSION, HANGING DROP, temperature 303K

Unit Cell:

a: 59.630 Å b: 59.695 Å c: 101.540 Å α: 81.38° β: 87.82° γ: 88.82°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 2.38 Solvent Content: 48.25

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	?	2.39	34.645	49224	1997	89.59	0.1699	0.2225	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.39	50.0	89.7	?	?	?	?	54876	49244	2.0	2.0	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		? K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-G	?	APS	21-ID-G

Software