X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 277 0.1 M MES 25% PEG 6K, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 43.080 Å b: 173.730 Å c: 44.450 Å α: 90.000° β: 92.590° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.440 Solvent Content: 49.660
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.860 43.039 53865 2488 98.8300 0.1843 0.2101 27.3025
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.860 43.039 99.600 ? 0.060 15.300 4.200 53895 53895 0 0 25
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.860 1.970 99.300 ? 0.512 1.500 4.200 7796
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.0 SLS X06DA
Software
Software Name Purpose Version
SCALA data scaling 3.3.20
PHASER phasing .
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.10
XDS data reduction .
XSCALE data scaling .
BUSTER refinement 2.11.2