ISDA: 4E5V

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X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	?	293	20.00% polyethylene glycol 3350, 0.200M ammonium fluoride, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Unit Cell:

a: 42.590 Å b: 95.370 Å c: 70.600 Å α: 90.000° β: 102.140° γ: 90.000°

Symmetry:

Space Group: P 1 21 1

Crystal Properties:

Matthew's Coefficient: 2.19 Solvent Content: 43.96

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MAD	THROUGHOUT	1.7500	29.832	51539	2597	92.8100	0.1491	0.1740	18.5614

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.75	29.832	81.300	0.066	?	7.240	?	?	51578	?	-3.000	15.741

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.750	1.810	80.300	?	?	2.0	?	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SSRL BEAMLINE BL11-1	0.91837, 0.97941, 0.97882	SSRL	BL11-1

Software

Software Name	Purpose	Version
MolProbity	model building	3beta29
PDB_EXTRACT	data extraction	3.10
SHELX	phasing	.
SHARP	phasing	.
XSCALE	data scaling	December 6, 2010
BUSTER-TNT	refinement	2.10.0
XDS	data reduction	.
SHELXD	phasing	.
BUSTER	refinement	2.10.0

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