X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.8 298 Tracking Code C4, 0.1M Tris pH 7.8, 0.2M LiCl, 0.1M Na2SO4, 17.5% w/v PEG3350, 10% glycerol cryo., vapor diffusion, sitting drop, temperature 298K
Unit Cell:
a: 40.780 Å b: 91.930 Å c: 61.430 Å α: 90.000° β: 96.300° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.58 Solvent Content: 52.37
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.100 45.970 25419 1278 96.620 0.201 0.231 29.942
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.100 45.97 96.600 0.066 ? 11.710 2.70 26336 25440 -3.00 -3.00 40.090
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.15 96.90 ? ? 3.5 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-B 1.033180 APS 23-ID-B
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing .
REFMAC refinement 5.6.0117
PDB_EXTRACT data extraction 3.004
Blu-Ice data collection .
XDS data reduction .