ISDA: 4DM5

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	9	298	0.01M Na-Borate, 1.7M Na-Citrate, Glycerol 2.5%, 0.01M Tris, 0.125M NaCl, 0.001M DTT , pH 9, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Unit Cell:

a: 39.130 Å b: 44.260 Å c: 59.280 Å α: 94.20° β: 93.92° γ: 116.07°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 1.95 Solvent Content: 36.81

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	1.50	39.49	52232	1616	94.92	0.18002	0.20854	31.820

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.5	39.49	92.2	?	?	?	?	?	104647	.	3.56	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.50	1.54	92.7	?	?	?	?	7813

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SOLEIL BEAMLINE PROXIMA 1	0.97926	SOLEIL	PROXIMA 1

Software