X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 297 0.1 M Bis-Tris/HCl, 20% PEG MME 5000, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 297K
Unit Cell:
a: 125.270 Å b: 84.467 Å c: 49.642 Å α: 90.00° β: 100.54° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.82 Solvent Content: 56.36
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.61 48.80 15514 901 99.77 0.1865 0.2279 104.60
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.60 50.00 99.8 0.089 ? 24.4 5.8 15596 15567 . -3 100.03
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.60 2.64 100 ? ? 2.35 3.7 747
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97904 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
Auto-Rickshaw phasing .
SHELX model building .
ABS model building .
HELICAP model building .
BUCCANEER model building .
Coot model building .
BUSTER refinement 2.10.0
HKL-3000 data reduction .
HKL-3000 data scaling .
SHELX phasing .
MLPHARE phasing .
DM phasing .
ARP/wARP model building .