X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 291 5mM UDP, 5mM 3PG, 5mM MnCl2, Tris-HCL pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 291K
Unit Cell:
a: 100.316 Å b: 100.316 Å c: 127.026 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: I 41
Crystal Properties:
Matthew's Coefficient: 4.37 Solvent Content: 71.84
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.980 39.36 42399 1946 96.8400 0.1785 0.2054 41.9334
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.98 39.36 96.9 0.062 ? 12.4 3.8 43786 42409 0 -3.0 33.710
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.98 2.10 98.4 ? ? 2.02 3.8 6950
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID23-2 0.87260 ESRF ID23-2
Software
Software Name Purpose Version
PHASER phasing .
PHENIX refinement 1.7.2_869
PDB_EXTRACT data extraction 3.10
MxCuBE data collection .
XDS data reduction .
XDS data scaling .