ISDA: 4DDD

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.50	290	EBS SCREEN JCSG+ H6: 100MM BISTRIS PH 6.5, 17% PEG 10K, 100MM AMMONIUM ACETATE, EHCHA.00493.A.A2 PS01157 AT 18MG/ML; CRYSTAL FOR PHASING WAS SOAKED IN CRYSTALLIZATION BUFFER CONTAINING 1M IODIDE, PH 8.5., VAPOR DIFFUSION, SITTING DROP, temperature 290K

Unit Cell:

a: 62.710 Å b: 65.440 Å c: 90.970 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 21 21 21

Crystal Properties:

Matthew's Coefficient: 2.59 Solvent Content: 52.45

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	1.90	45.49	29858	1515	99.0	0.161	0.188	13.57

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.900	50	99.0	0.06100	0.061	21.2000	5.94	30172	29858	0	-3.000	22.47

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.90	1.95	91.3	?	0.309	3.600	2.8	2168

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100.0 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
ROTATING ANODE	RIGAKU MICROMAX-007 HF	1.5418	?	?

Software