X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.5 298 2.0 M sodium chloride, 0.1 M sodium acetate, pH 4.6, 35% GLYCEROL AS CRYOPROTECTANT, vapor diffusion, hanging drop, temperature 298K, VAPOR DIFFUSION, HANGING DROP
Unit Cell:
a: 153.690 Å b: 153.690 Å c: 153.690 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: F 2 3
Crystal Properties:
Matthew's Coefficient: 3.29 Solvent Content: 62.61
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.3500 18.7800 4298 215 97.2600 0.2316 0.2398 135.4875
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.350 18.8 96.600 0.056 ? 24.140 ? 4298 4298 ? -3.000 81.567
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.350 3.440 98.800 ? ? 4.390 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.9791 APS 24-ID-C
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.3.0
BUSTER-TNT refinement .
PDB_EXTRACT data extraction 3.10
ADSC data collection Quantum
XDS data reduction .
BUSTER refinement 2.10.0
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