X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.4 293 0.1M sodium citrate, pH 5.4, 0.3-0.4M ammonium sulphate, 30-35% PEG-400, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 133.650 Å b: 166.930 Å c: 132.820 Å α: 90.00° β: 119.76° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 4.08 Solvent Content: 69.83
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.493 30.015 59310 2014 92.53 0.2153 0.2513 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.5 30 93.1 ? ? ? ? 63780 59380 -3 -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.50 3.58 88.2 ? 0.719 1.957 4.7 3463
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 90 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1 SLS X06SA
Software
Software Name Purpose Version
DENZO data reduction .
PHENIX model building (phenix.refine: 1.7.2_869)
PHENIX refinement (phenix.refine: 1.7.2_869)
SCALEPACK data scaling .
PHENIX phasing 1.7.2_869
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