X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 293 CRYSTALS WERE OBTAINED AT 293 K BY THE HANGING DROP VAPOUR DIFFUSION METHOD. DROPS WERE PREPARED BY MIXING 1 MICROLITER OF CHAV-GTH (4 MG/ML) SUPPLEMENTED WITH 0.2% N-DODECYL B-MALTOSIDE WITH 1 MICROLITER OF THE RESERVOIR SOLUTION (12% PEG 3350, 0.1 M SODIUM ACETATE PH 4.6) AND EQUILIBRATED AGAINST 500 MICROLITERS OF RESERVOIR SOLUTION.
Unit Cell:
a: 365.590 Å b: 83.500 Å c: 60.820 Å α: 90.00° β: 96.95° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.01 Solvent Content: 59.18
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.600 49.128 21188 1056 99.27 0.1966 0.2595 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.60 49.13 99.3 0.14 ? 7.49 3.1 ? 21199 ? 1.79 86.05
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.60 3.73 99.6 ? 1.79 3.2
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID29 ? ESRF ID29
Software
Software Name Purpose Version
PHENIX refinement (PHENIX.REFINE)
XDS data reduction .
XSCALE data scaling .
PHASER phasing .