X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? ? 13 % PEG8000, HEPES, MOPS PH 6.2, CACL2, 10MM SLEX-OTMSE
Unit Cell:
a: 52.290 Å b: 58.670 Å c: 58.870 Å α: 76.03° β: 86.28° γ: 86.31°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.8 Solvent Content: 56.1
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.41 28.32 25216 1298 96.45 0.2168 0.2528 79.30
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.41 28.28 95.4 0.04 ? 8.80 1.8 ? 25239 ? 2.0 66.77
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.41 2.53 90.2 ? 2.00 1.8
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA ? SLS X06SA
Software
Software Name Purpose Version
BUSTER refinement 2.10.0
XDS data reduction .
SCALA data scaling .
PHASER phasing .