X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.50 291 CRYSTALS OF DEPHOSPHORYLATED A(122-403) IN COMPLEX WITH AMPPCP WERE OBTAINED BY MIXING A 2:1 RATIO OF 570UM (18MG/ML) DEP A(122-403) AND 1MM AMPPCP WITH MOTHER LIQUOR (0.2M AMMONIUM SULFATE, 0.2M TRISHCL PH 7.50, 30% (W/V) PEG3350). THE CRYSTALS WERE GROWN AT 18C BY VAPOR DIFFUSION AND THE HANGING DROP METHOD.
Unit Cell:
a: 83.468 Å b: 83.468 Å c: 172.630 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 61 2 2
Crystal Properties:
Matthew's Coefficient: 2.96 Solvent Content: 58.54
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.79 55.42 8459 941 99.97 0.22939 0.30601 99.433
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.79 55.40 100.0 0.08 ? 19.80 15.7 ? 9400 ? 1.8 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.79 2.87 100.0 ? 1.80 16.7
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 ? ALS 8.2.2
Software
Software Name Purpose Version
REFMAC refinement 5.7.0029
iMOSFLM data reduction .
SCALA data scaling .
MOLREP phasing .