X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 291 CRYSTALS OF DEPHOSPHORYLATED A(122-403) IN COMPLEX WITH AMPPCP AND TPX2(1-43) WERE GROWN AT 18C BY VAPOR DIFFUSION AND THE HANGING DROP OBTAINED BY COMBINING 300UM DEP A(122-403) WITH 1.5MM AMPPCP AND 300UM TPX2(1-43) WITH 0.2M LITHIUM SULFATE MONOHYDRATE, 0.1M BISTRIS PH5.5, 25% PEG3350.
Unit Cell:
a: 49.927 Å b: 86.717 Å c: 153.546 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.57 Solvent Content: 52.23
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.69 47.48 18104 1035 99.98 0.20526 0.28857 53.940
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.69 47.50 100.0 0.26 ? 8.00 6.9 ? 19139 ? 2.3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.69 2.76 100.0 ? 2.30 7.2
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 ? ALS 8.2.2
Software
Software Name Purpose Version
REFMAC refinement 5.7.0029
iMOSFLM data reduction .
SCALA data scaling .
MOLREP phasing .
Feedback Form
Name
Email
Institute
Feedback