ISDA: 4C23

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.2	?	SPFCSK AT A CONCENTRATION OF 24 MG ML-1, BUFFERED IN 20 MM TRIS-HCL (PH 7.2), 150 MM NACL, 1 MM MANGANESE CHLORIDE, AND 1 MM DTT WAS CRYSTALLIZED BY MIXING EQUAL VOLUMES WITH A SOLUTION CONSISTING OF 4% (V PER V) ETHYLENE-GLYCOL, 100 MM 4-(2-HYDROXYETHYL)-1-PIPERAZINEETHANESULFONIC ACID (PH 7.5), AND 1.50 M AMMONIUM SULPHATE

Unit Cell:

a: 60.624 Å b: 60.624 Å c: 280.013 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: P 43

Crystal Properties:

Matthew's Coefficient: 2.43 Solvent Content: 49.35

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.00	36.98	63900	3418	99.40	0.16863	0.21597	31.896

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.00	37.00	99.6	0.05	?	20.50	6.4	?	67536	?	0.0	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.00	2.11	100.0		?	9.20	6.9

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SSRL BEAMLINE BL12-2	?	SSRL	BL12-2

Software