ISDA: 4BX5

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	6.5	?	2.5 % W/V POLYETHYLENE GLYCOL (PEG) 1000, 12.5 % W/V PEG 3350, 12.5 % V/V MPD, 30 MM OF ETHYLENE GLYCOL MIX (DI-ETHYLENEGLYCOL, TRI-ETHYLENEGLYCOL, TETRA-ETHYLENEGLYCOL, PENTA-ETHYLENEGLYCOL) AND 0.1 M MES/IMIDAZOLE PH 6.5, CORRESPONDING TO CONDITION E4 OF THE MORPHEUS SCREEN

Unit Cell:

a: 46.220 Å b: 84.240 Å c: 58.250 Å α: 90.00° β: 98.81° γ: 90.00°

Symmetry:

Space Group: P 1 21 1

Crystal Properties:

Matthew's Coefficient: 2.12 Solvent Content: 41.44

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	?	1.431	42.120	75104	3785	92.58	0.1614	0.1873	22

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.43	42.12	92.6	0.06	?	11.40	3.6	?	75108	?	2.0	14.65

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.43	1.48	91.6		?	2.21	3.6

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	DIAMOND BEAMLINE I04-1	?	Diamond	I04-1

Software