X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 296 CRYSTALS WERE GROWN THROUGH REVERSE VAPOR DIFFUSION IN HANGING DROPS AT 23 C BY MIXING 1 UL IN-DNA COMPLEX SOLUTION (20 MM HEPES, PH 7.5, 500 MM NACL, 5 MM MGCL2, 2 MM TCEP AND 8% (W/V) GLYCEROL) WITH 1 UL RESERVOIR SOLUTION (50 MM NA CACODYLATE, PH 6.5, 100 MM MGCL2, 1 MM COCL3 AND 6% (V/V) ETHANOL).
Unit Cell:
a: 160.617 Å b: 160.617 Å c: 125.092 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 21 2
Crystal Properties:
Matthew's Coefficient: 2.88 Solvent Content: 57.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.263 29.141 24101 1223 92.66 0.1868 0.2263 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.26 30.00 98.8 ? 0.11 14.60 6.3 ? 25740 ? 2.0 75.30
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.26 3.32 100.0 0.62 2.00 6.3
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM ? APS 22-BM
Software
Software Name Purpose Version
PHENIX refinement (PHENIX.REFINE)
DENZO data reduction .
SCALEPACK data scaling .
MOLREP phasing .