X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? ? 100 MM HEPES.NAOH PH 8.0, 10 MM MGCL2, 5 MM NICL2, 7-9% (W/V) PEG 3350, 4% (V/V) 2,2,2-TRIFLUOROETHANOL.
Unit Cell:
a: 105.750 Å b: 105.750 Å c: 424.270 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: H 3 2
Crystal Properties:
Matthew's Coefficient: 2.92 Solvent Content: 57.84
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.73 42.82 24564 1256 98.70 0.2162 0.2501 67.86
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.73 84.08 99.3 0.08 ? 11.00 3.7 ? 24571 ? 2.0 74.07
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.73 2.80 99.9 ? 2.00 3.7
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I04 ? Diamond I04
Software
Software Name Purpose Version
XDS data reduction .
SCALA data scaling .
SHELX phasing .
SHARP phasing .
BUSTER refinement 2.10.0