4B8W

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? ? 0.2 M NACL, 0.1 M BIS-TRIS PH 5.5, 25% PEG 3350
Unit Cell:
a: 111.470 Å b: 111.470 Å c: 46.920 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 42
Crystal Properties:
Matthew's Coefficient: 1.93 Solvent Content: 36.41
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.75 40.32 14273 697 93.28 0.2035 0.2524 69.35
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.75 40.32 93.5 0.11 ? 9.20 3.1 ? 14273 ? 1.3 79.33
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.75 2.90 93.7 ? 1.30 2.6
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I24 ? Diamond I24
Software
Software Name Purpose Version
BUSTER refinement 2.11.2
XDS data reduction .
SCALA data scaling .
PHASER phasing .