4AYW

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.5 ? 0.1 M SODIUM CHLORIDE, 5%(V/V)JEFFAMINE M-600, 0.1 M GLYCINE PH 9.5, 34%(V/V) PEG 400 CRYSTAL SOAKED BRIEFLY IN 10MM LUTETIUM CHLORIDE PRIOR TO DATA COLLECTION
Unit Cell:
a: 101.700 Å b: 101.700 Å c: 294.730 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 62 2 2
Crystal Properties:
Matthew's Coefficient: 3.28 Solvent Content: 62.52
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SIRAS THROUGHOUT 3.30 37.99 14134 585 98.31 0.2522 0.2861 109.09
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.30 38.50 98.4 0.13 ? 11.00 9.1 ? 14186 ? 1.0 86.82
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.30 3.48 90.6 ? 2.20 3
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I24 ? Diamond I24
Software
Software Name Purpose Version
BUSTER refinement 2.11.2
MOSFLM data reduction .
SCALA data scaling .
SHELXD phasing SHARP