ISDA: 4AH6

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	?	SITTING DROPLETS WERE PREPARED BY MIXING 0.5 UL HSADRS2 AT 10.6 MG/ML (IN 50 MM HEPES-NA PH 7.5, 150 MM NACL, 0.1 MM EDTA, 10% (V/V) GLYCEROL AND 1 MM DTT) WITH 0.5 UL BOTTOM PHASE OF A BIPHASIC MIXTURE OF 50 MM BIS-TRIS PH 5.5, 20% (M/V) PEG-3350 AND 1 M AMMONIUM SULFATE AND EQUILIBRATED BY VAPOR DIFFUSION OVER 50 UL OF THE LATTER SOLUTION.

Unit Cell:

a: 142.400 Å b: 82.600 Å c: 146.300 Å α: 90.00° β: 100.40° γ: 90.00°

Symmetry:

Space Group: P 1 2 1

Crystal Properties:

Matthew's Coefficient: 3.25 Solvent Content: 62

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	?	3.700	29.916	35680	1780	98.82	0.2222	0.2801	108.2

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
3.70	89.00	98.8	0.18	?	9.40	7.2	?	35768	?	-3.0	88.02

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	3.70	3.80	91.2		?	2.10	4.0

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SLS BEAMLINE X10SA	?	SLS	X10SA

Software